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Title: Precise measurement of single carbon nanocoils using focused ion beam technique

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4945724· OSTI ID:22591578
; ; ;  [1];  [2];  [3];  [4]
  1. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, Toyohashi, Aichi 441-8580 (Japan)
  2. Department of Electrical and Computer Engineering, National Institute of Technology, Gifu College, Motosu, Gifu 501-0495 (Japan)
  3. Fuji Research Laboratory, Tokai Carbon Co., Ltd., Oyama, Shizuoka 410-1431 (Japan)
  4. Department of Environmental Sciences, University of Yamanashi, Kofu, Yamanashi 400-8510 (Japan)

We have developed a precise resistivity measurement system for quasi-one-dimensional nanomaterials using a focused ion beam. The system enables the resistivity of carbon nanocoils (CNCs) to be measured and its dependence on coil geometry to be elucidated. At room temperature, the resistivity of CNCs tended to increase with coil diameter, while that of artificially graphitized CNCs remained constant. These contrasting behaviors indicate coil-diameter-induced enhancement in structural disorder internal to CNCs. Low-temperature resistivity measurements performed on the CNCs revealed that electron transport through the helical axis is governed by the variable range hopping mechanism. The characteristic temperature in variable range hopping theory was found to systematically increase with coil diameter, which supports our theory that the population of sp{sup 2}-domains in CNCs decreases considerably with coil diameter.

OSTI ID:
22591578
Journal Information:
Applied Physics Letters, Vol. 108, Issue 15; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English