Temporal resolution limit estimation of x-ray streak cameras using a CsI photocathode

Journal Article · Fri Aug 28 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4928675· OSTI ID:22494785

Li, Xiang; Gu, Li; Zong, Fangke; Zhang, Jingjin; Yang, Qinlao ^[1]

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1. Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Institute of Optoelectronics, Shenzhen University, Shenzhen 518060 (China)

A Monte Carlo model is developed and implemented to calculate the characteristics of x-ray induced secondary electron (SE) emission from a CsI photocathode used in an x-ray streak camera. Time distributions of emitted SEs are investigated with an incident x-ray energy range from 1 to 30 keV and a CsI thickness range from 100 to 1000 nm. Simulation results indicate that SE time distribution curves have little dependence on the incident x-ray energy and CsI thickness. The calculated time dispersion within the CsI photocathode is about 70 fs, which should be the temporal resolution limit of x-ray streak cameras that use CsI as the photocathode material.

• OSTI ID: 22494785
• Journal Information: Journal of Applied Physics, Vol. 118, Issue 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CESIUM IODIDES
COMPUTERIZED SIMULATION
ELECTRONS
KEV RANGE
MONTE CARLO METHOD
PHOTOCATHODES
SECONDARY EMISSION
STREAK CAMERAS
TIME DEPENDENCE
TIME RESOLUTION
X RADIATION