skip to main content

Title: Simulations of multi-contrast x-ray imaging using near-field speckles

X-ray dark-field and phase-contrast imaging using near-field speckles is a novel technique that overcomes limitations inherent in conventional absorption x-ray imaging, i.e. poor contrast for features with similar density. Speckle-based imaging yields a wealth of information with a simple setup tolerant to polychromatic and divergent beams, and simple data acquisition and analysis procedures. Here, we present a simulation software used to model the image formation with the speckle-based technique, and we compare simulated results on a phantom sample with experimental synchrotron data. Thorough simulation of a speckle-based imaging experiment will help for better understanding and optimising the technique itself.
Authors:
 [1] ;  [2] ;  [3] ; ;  [1] ;  [4] ;  [5]
  1. Lehrstuhl für Biomedizinische Physik, Physik-Department & Institut für Medizintechnik, Technische Universität München, 85748 Garching (Germany)
  2. (United Kingdom)
  3. Department of Physics & Astronomy, University College London, London, WC1E 6BT (United Kingdom)
  4. Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire, OX11 0DE (United Kingdom)
  5. (Germany)
Publication Date:
OSTI Identifier:
22494386
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1696; Journal Issue: 1; Conference: XRM 2014: 12. international conference on X-ray microscopy, Melbourne (Australia), 26-31 Oct 2014; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION; BEAMS; COMPARATIVE EVALUATIONS; COMPUTER CODES; DATA ACQUISITION; DENSITY; IMAGES; PHANTOMS; SIMULATION; SYNCHROTRONS; X RADIATION