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Title: Scattered hard X-ray and γ-ray generation from a chromatic electron beam

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4935480· OSTI ID:22492916
 [1]; ;  [2]
  1. Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
  2. Voss Scientific, Albuquerque, New Mexico 87108 (United States)

An array of photon diagnostics has been deployed on a high power relativistic electron beam diode. Electrons are extracted through a 17.8 cm diode from the surface discharge of a carbon fiber velvet cathode with a nominal diode voltage of 3.8 MV. <10% of the 100 ns electron pulse is composed of off energy electrons (1–3 MeV) accelerated during the rise and fall of the pulse that impact the stainless steel beam pipe and generate a Bremsstrahlung spectrum of 0.1–3 MeV photons with a total count of 10{sup 11}. The principal objective of these experiments is to quantify the electron beam dynamics and spatial dynamics of the hard X-ray and γ-ray flux generated in the diode region. A qualitative comparison of experimental and calculated results are presented, including time and energy resolved electron beam propagation and scattered photon measurements with X-ray PIN diodes and a photomultiplier tube indicating a dose dependence on the diode voltage >V{sup 4} and detected photon counts of nearly 10{sup 6} at a radial distance of 1 m which corresponds to dose ∼40 μrad at 1 m.

OSTI ID:
22492916
Journal Information:
Journal of Applied Physics, Vol. 118, Issue 18; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English

Cited By (1)