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Title: Simultaneous negative refraction and focusing of fundamental frequency and second-harmonic fields by two-dimensional photonic crystals

Simultaneous negative refraction for both the fundamental frequency (FF) and second-harmonic (SH) fields in two-dimensional nonlinear photonic crystals have been found through both the physical analysis and exact numerical simulation. By combining such a property with the phase-matching condition and strong second-order susceptibility, we have designed a SH lens to realize focusing for both the FF and SH fields at the same time. Good-quality non-near field images for both FF and SH fields have been observed. The physical mechanism for such SH focusing phenomena has been disclosed, which is different from the backward SH generation as has been pointed out in the previous investigations. In addition, the effect of absorption losses on the phenomena has also been discussed. Thus, potential applications of these phenomena to biphotonic microscopy technique are anticipated.
Authors:
 [1] ;  [2] ;  [1]
  1. School of Physics, Beijing Institute of Technology and Beijing Key Laboratory of Fractional Signals and Systems, Beijing 100081 (China)
  2. (China)
Publication Date:
OSTI Identifier:
22492707
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 12; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABSORPTION; COMPUTERIZED SIMULATION; CRYSTALS; DESIGN; FOCUSING; IMAGES; LENSES; MICROSCOPY; NONLINEAR PROBLEMS; REFRACTION; TWO-DIMENSIONAL CALCULATIONS; TWO-DIMENSIONAL SYSTEMS