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Title: Investigation on thermal evaporated CH{sub 3}NH{sub 3}PbI{sub 3} thin films

CH{sub 3}NH{sub 3}I, PbI{sub 2} and CH{sub 3}NH{sub 3}PbI{sub 3} films were fabricated by evaporation and characterized with X-ray Photoelectron Spectroscopy (XPS) and X-ray diffraction (XRD). The XPS results indicate that the PbI{sub 2} and CH{sub 3}NH{sub 3}PbI{sub 3} films are more uniform and stable than the CH{sub 3}NH{sub 3}I film. The atomic ratio of the CH{sub 3}NH{sub 3}I, PbI{sub 2} and CH{sub 3}NH{sub 3}PbI{sub 3} films are C:N:I=1.00:1.01:0.70, Pb:I= 1.00:1.91 and C: N: Pb: I = 1.29:1.07:1.00:2.94, respectively. The atomic ratio of CH{sub 3}NH{sub 3}PbI{sub 3} is very close to that of the ideal perovskite. Small angle x-ray diffraction results demonstrate that the as evaporated CH{sub 3}NH{sub 3}PbI{sub 3} film is crystalline. The valence band maximum (VBM) and work function (WF) of the CH{sub 3}NH{sub 3}PbI{sub 3} film are about 0.85eV and 4.86eV, respectively.
Authors:
; ;  [1] ; ; ;  [2] ;  [3]
  1. School of Physics and Electronics, Central South University, Changsha, Hunan, 410083 (China)
  2. Department of Physics and Astronomy, University of Rochester, Rochester, NY, 14627 (United States)
  3. Instrumental Analysis Center, Sun Yat-Sen University, Guangzhou, 510275 (China)
Publication Date:
OSTI Identifier:
22492341
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 9; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; AMMONIUM COMPOUNDS; ELECTRONIC STRUCTURE; EVAPORATION; HYDROCARBONS; LEAD IODIDES; PEROVSKITE; THIN FILMS; VALENCE; WORK FUNCTIONS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY