Investigation on thermal evaporated CH{sub 3}NH{sub 3}PbI{sub 3} thin films

Journal Article · Tue Sep 15 00:00:00 EDT 2015 · AIP Advances

DOI:https://doi.org/10.1063/1.4930545· OSTI ID:22492341

Li, Youzhen; Xu, Xuemei; Yang, Junliang ^[1]; Wang, Chenggong; Wang, Congcong; Gao, Yongli ^[2]; Xie, Fangyan ^[3]

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1. School of Physics and Electronics, Central South University, Changsha, Hunan, 410083 (China)
2. Department of Physics and Astronomy, University of Rochester, Rochester, NY, 14627 (United States)
3. Instrumental Analysis Center, Sun Yat-Sen University, Guangzhou, 510275 (China)

CH{sub 3}NH{sub 3}I, PbI{sub 2} and CH{sub 3}NH{sub 3}PbI{sub 3} films were fabricated by evaporation and characterized with X-ray Photoelectron Spectroscopy (XPS) and X-ray diffraction (XRD). The XPS results indicate that the PbI{sub 2} and CH{sub 3}NH{sub 3}PbI{sub 3} films are more uniform and stable than the CH{sub 3}NH{sub 3}I film. The atomic ratio of the CH{sub 3}NH{sub 3}I, PbI{sub 2} and CH{sub 3}NH{sub 3}PbI{sub 3} films are C:N:I=1.00:1.01:0.70, Pb:I= 1.00:1.91 and C: N: Pb: I = 1.29:1.07:1.00:2.94, respectively. The atomic ratio of CH{sub 3}NH{sub 3}PbI{sub 3} is very close to that of the ideal perovskite. Small angle x-ray diffraction results demonstrate that the as evaporated CH{sub 3}NH{sub 3}PbI{sub 3} film is crystalline. The valence band maximum (VBM) and work function (WF) of the CH{sub 3}NH{sub 3}PbI{sub 3} film are about 0.85eV and 4.86eV, respectively.

• OSTI ID: 22492341
• Journal Information: AIP Advances, Vol. 5, Issue 9; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
AMMONIUM COMPOUNDS
ELECTRONIC STRUCTURE
EVAPORATION
HYDROCARBONS
LEAD IODIDES
PEROVSKITE
THIN FILMS
VALENCE
WORK FUNCTIONS
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY