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Title: Thickness and microstructure effects in the optical and electrical properties of silver thin films

The optical and electrical response of metal thin films approaching thicknesses in the range of the electron mean free path is highly affected by electronic scattering with the interfaces and defects. Here, we present a theoretical and experimental study on how thickness and microstructure affect the properties of Ag thin films. We are able to successfully model the electrical resistivity and IR optical response using a thickness dependent electronic scattering time. Remarkably, the product of electronic scattering time and resistivity remains constant regardless of the thickness (τx ρ = C), with a value of 59 ± 2 μΩ cm ⋅ fs for Ag films in the investigated range from 3 to 74 nm. Our findings enable us to develop a theoretically framework that allows calculating the optical response of metal thin films in the IR by using their measured thickness and resistivity. An excellent agreement is found between experimental measurements and predicted values. This study also shows the theoretical lower limit for emissivity in Ag thin films according to their microstructure and thickness. Application of the model presented here will allow rapid characterization of the IR optical response of metal thin films, with important application in a broad spectrum ofmore » fundamental and industrial applications, including optical coatings, low-emissivity windows and semiconductor industry.« less
Authors:
; ; ;  [1]
  1. Intermolecular, Inc., 3011 North First Street, San Jose, CA 95134 (United States)
Publication Date:
OSTI Identifier:
22492208
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; COATINGS; ELECTRIC CONDUCTIVITY; ELECTRONS; EMISSION SPECTRA; EMISSIVITY; INTERFACES; MEAN FREE PATH; MICROSTRUCTURE; SCATTERING; SEMICONDUCTOR MATERIALS; SILVER; THIN FILMS