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Title: Magnetoelectric properties of (Pb{sub 0.60}Sr{sub 0.40})TiO{sub 3}-CFO composite thin film synthesized by metallo-organic decomposition

(Pb{sub 0.60}Sr{sub 0.40}) TiO{sub 3}-CFO composite thin films were grown on Pt/TiO{sub 2}/Si substrate by novel metallo-Organic process using spin coating technique. The structural, surface morphology and micro structural properties were confirmed by X-Ray diffraction (XRD), Raman spectroscopy, atomic force microscope (AFM) and TEM respectively. The lattice constant of the composite thin film crystallized in the pervoskite and spinel phase was 3.9531 and 8.571 วบ. Excellent ferroelectric behavior at 10V was observed, a room temperature magnetic hysteresis shows good results. The saturation magnetization value of the bilayer thin film is lower than that of the pure CFO film which is may be attributed to presence of non ferromagnetic PST layer A high initial behavior of dynamic ME response coefficient for the film was observed. The ME effect of the film strongly depends on the magnetic bias.
Authors:
;  [1] ;  [2]
  1. Department of Physics Himachal Pradesh University Shimla-171005 India (India)
  2. National Physical Laboratory, New Delhi (India)
Publication Date:
OSTI Identifier:
22490233
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMIC FORCE MICROSCOPY; ELECTRICAL PROPERTIES; FERROELECTRIC MATERIALS; HYSTERESIS; LATTICE PARAMETERS; LEAD COMPOUNDS; MAGNETIC PROPERTIES; MAGNETIZATION; PLATINUM; RAMAN SPECTROSCOPY; SILICON; SPIN-ON COATING; STRONTIUM TITANATES; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION