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Title: Multipactor threshold calculation of coaxial transmission lines in microwave applications with nonstationary statistical theory

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.4928421· OSTI ID:22490035
; ;  [1]; ;  [2];  [3]
  1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049 (China)
  2. National Key Laboratory of Science and Technology on Space Science, China Academy of Space Technology (Xi'an), Xi'an 710000 (China)
  3. Center for Pulsed Power and Power Electronics, Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, Texas 79409 (United States)

This paper presents a statistical theory for the initial onset of multipactor breakdown in coaxial transmission lines, taking both the nonuniform electric field and random electron emission velocity into account. A general numerical method is first developed to construct the joint probability density function based on the approximate equation of the electron trajectory. The nonstationary dynamics of the multipactor process on both surfaces of coaxial lines are modelled based on the probability of various impacts and their corresponding secondary emission. The resonant assumption of the classical theory on the independent double-sided and single-sided impacts is replaced by the consideration of their interaction. As a result, the time evolutions of the electron population for exponential growth and absorption on both inner and outer conductor, in response to the applied voltage above and below the multipactor breakdown level, are obtained to investigate the exact mechanism of multipactor discharge in coaxial lines. Furthermore, the multipactor threshold predictions of the presented model are compared with experimental results using measured secondary emission yield of the tested samples which shows reasonable agreement. Finally, the detailed impact scenario reveals that single-surface multipactor is more likely to occur with a higher outer to inner conductor radius ratio.

OSTI ID:
22490035
Journal Information:
Physics of Plasmas, Vol. 22, Issue 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 1070-664X
Country of Publication:
United States
Language:
English