Effect of radiation on properties of ENR/PVC/SiO{sub 2} membrane

Journal Article · Fri Sep 25 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4931308· OSTI ID:22488998

Ismail, Nur Farahein Hadina; Abdullah, Ibrahim; Daik, Rusli; Ahmad, Ishak; Jamil, Suzereen; Lazim, Mohammad Azwan Mat; Othaman, Rizafizah ^[1]

---

1. School of Chemical Sciences and Food Technology, Universiti Kebangsaan Malaysia, 43600 UKM Bangi, Selangor Darul Ehsan. Malaysia (Malaysia)

In this study epoxidised natural rubber (ENR)/polyvinyl chloride (PVC) matrix was prepared by melt blending. The matrix was swelled in THF and silica as a filler was introduced to the solution to generate pore formation. The ENR/PVC/10 % SiO{sub 2} membrane was prepared using a casting knife technique. The membrane was irradiated using 2 MeV electron beam accelerator at a dose range of 10-100 kGy. The effect of electron beam irradiation of the membrane was studied by undergo characterization of Scanning electron microscope (SEM) and Fourier transform infra red (FTIR). Morphological studies showed that pores generated in ENR/PVC/10 % SiO{sub 2} membrane increased with the dosage of radiation. While FTIR analysis showed the presence of peak of Si-O-Si asymmetric stretching at 834 cm{sup −1}. There are no significant changes in the functional group before and after radiation.

• OSTI ID: 22488998
• Journal Information: AIP Conference Proceedings, Vol. 1678, Issue 1; Conference: Universiti Kebangsaan Malaysia, Faculty of Science and Technology 2015 Postgraduate Colloquium, Selangor (Malaysia), 15-16 Apr 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTROSCOPY
ASYMMETRY
ELECTRON BEAMS
FILLERS
FOURIER TRANSFORMATION
INFRARED SPECTRA
IRRADIATION
MATRIX MATERIALS
MEMBRANES
MEV RANGE
NATURAL RUBBER
PVC
RADIATION DOSES
RADIATION EFFECTS
SCANNING ELECTRON MICROSCOPY
SILICON OXIDES
TETRAHYDROFURAN