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Title: Microscopic evolution of dielectric nanoparticles at different calcination temperatures synthesized via sol-gel auto-combustion

Dielectric nano powder synthesis is carried by a simple and fast sol-gel auto-combustion method. The transformation of crystalline phases of as-synthesized nano powders is investigated through the detailed transmission electron microscopy (TEM), revealed the crystallographic alterations and morphological information even at lattice scale. From specific area electron diffraction (SAED) pattern, has specified the d-spacing and corresponding planes supported by the observed lattice fringes. The morphological characterization of nanoparticles is performed through field-emission scanning electron microscopy (FESEM), exhibiting the increment in particle size due to agglomeration with the increase in annealing temperature. Furthermore, EDX pattern has been used to verify the formation of nanoparticles by revealing the presence of required elements.
Authors:
; ; ;  [1] ;  [2]
  1. Fundamental and Applied Sciences Department, Universiti Teknologi PETRONAS Bandar Seri Iskandar, 31750 Tronoh, Perak (Malaysia)
  2. Geoscience and Petroleum Engineering Department, Universiti Teknologi PETRONAS Bandar Seri Iskandar, 31750 Tronoh, Perak (Malaysia)
Publication Date:
OSTI Identifier:
22488605
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1669; Journal Issue: 1; Conference: SCMSM 2014: 23. scientific conference of Microscopy Society Malaysia, Tronoh (Malaysia), 10-12 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; AGGLOMERATION; ANNEALING; CALCINATION; COMBUSTION; DIELECTRIC MATERIALS; ELECTRON DIFFRACTION; FIELD EMISSION; NANOPARTICLES; PARTICLE SIZE; PHASE TRANSFORMATIONS; POWDERS; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY