Electronic structure of low work function electrodes modified by C{sub 16}H{sub 33}SH

Journal Article · Wed Oct 15 00:00:00 EDT 2014 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2014.05.010· OSTI ID:22420574

Lee, Hyunbok ^[1]; Park, Sang Han; Cho, Mann-Ho; Yi, Yeonjin ^[2]

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1. Department of Polymer Science and Engineering, University of Massachusetts, Amherst, MA, 01003 (United States)
2. Institute of Physics and Applied Physics, Yonsei University, 50 Yonsei-ro, Seodaemoon-Gu, Seoul, 120-749 (Korea, Republic of)

Highlights: • The electronic structure of pentacene/C{sub 16}H{sub 33}SH/Au is investigated. • The work function of Au is significantly decreased with C{sub 16}H{sub 33}SH treatment. • The reduced work function is attributed to its permanent dipole moment. - Abstract: Organic and printed electronics technologies require electrodes with low work functions to facilitate the transport of electrons in and out of various optoelectronic devices. We show that the surface modifier of 1-hexadecanethiol reduces the work function of conductors using in situ ultraviolet photoemission spectroscopy, and we combine experimental and theoretical methods to investigate the origin of the work function changes. The interfacial electronic structures of pentacene/1-hexadecanethiol/Au were investigated via in situ ultraviolet photoemission spectroscopy and X-ray photoemission spectroscopy in order to understand the change in the carrier injection barrier and chemical reactions upon surface modification. Theoretical calculations using density functional theory were also performed to understand the charge distribution of 1-hexadecanethiol, which affects the reduction of the work function. The 1-hexadecanethiol surface modifier is processed in air from solution, providing an appealing alternative to chemically-reactive low-work-function metals.

• OSTI ID: 22420574
• Journal Information: Materials Research Bulletin, Vol. 58; Conference: IFFM2013: International forum on functional materials, Jeju City (Korea, Republic of), 27-29 Jun 2013; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CHARGE DISTRIBUTION
DENSITY FUNCTIONAL METHOD
DIFFUSION BARRIERS
DIPOLE MOMENTS
ELECTRONIC STRUCTURE
ELECTRONS
GOLD
OPTOELECTRONIC DEVICES
PENTACENE
REDUCTION
SURFACES
THIOLS
ULTRAVIOLET RADIATION
WORK FUNCTIONS
X RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY