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Title: Growth dynamics of copper oxide nanowires in plasma at low pressures

The growth time dynamics of the copper oxide nanowires (NWs) in radiofrequency plasma discharge were investigated. Grounded copper samples were treated in argon-oxygen plasma with the discharge power of 150 W for sequenced times up to 20 min. After the treatment, the samples were analysed with scanning electron microscopy and image processing to obtain the length and aspect ratio of the NWs. A growth mode with the saturation was observed in dependence to NW length, where the maximal length of 5 μm was achieved in 20 min. However, the best NW aspect ratio had maximum of about 40 after 10 min of plasma treatment. To describe and understand nanowire growth mechanism, a theoretical model was developed and it is in agreement with the experiment. The model results indicate that different densities of the ion current to the side and top area of NW modify the NW growth in height and width. The NW growth is enhanced by presence of ions, and thus this implies that it can be controlled by discharge power. This explains much faster growth of copper oxide nanowires in plasma environment compared to prolonged thermal treatments.
Authors:
; ;  [1] ;  [2] ;  [3]
  1. Jozef Stefan Institute, Jamova cesta 39, SI-1000 Ljubljana, Slovenia, European Union (Slovenia)
  2. (Slovenia)
  3. Plasma Laboratory, National Aerospace University “KhAI,” Kharkov 61070 (Ukraine)
Publication Date:
OSTI Identifier:
22412987
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 4; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ARGON; ASPECT RATIO; COMPARATIVE EVALUATIONS; COPPER; COPPER OXIDES; ELECTRIC DISCHARGES; HEAT TREATMENTS; IMAGE PROCESSING; MATHEMATICAL MODELS; NANOWIRES; OXYGEN; PLASMA; RADIOWAVE RADIATION; SCANNING ELECTRON MICROSCOPY