Spatially and momentum resolved energy electron loss spectra from an ultra-thin PrNiO{sub 3} layer
- Central Facility of Electron Microscopy, University of Ulm, Albert-Einstein Allee 11, 89081 Ulm (Germany)
- Carl Zeiss Microscopy GmbH, Carl-Zeiss-Str. 22, 73447 Oberkochen (Germany)
- Institut des Matériaux Jean Rouxel, UMR6502, CNRS - Université de Nantes, 2 rue de la Houssinière, B.P.32229, 44322 Nantes Cedex (France)
- Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70579 Stuttgart (Germany)
We present an experimental approach which allows for the acquisition of spectra from ultra-thin films at high spatial, momentum, and energy resolutions. Spatially and momentum (q) resolved electron energy loss spectra have been obtained from a 12 nm ultra-thin PrNiO{sub 3} layer using a nano-beam electron diffraction based approach which enabled the acquisition of momentum resolved spectra from individual, differently oriented nano-domains and at different positions of the PrNiO{sub 3} thin layer. The spatial and wavelength dependence of the spectral excitations are obtained and characterized after the analysis of the experimental spectra using calculated dielectric and energy loss functions. The presented approach makes a contribution towards obtaining momentum-resolved spectra from nanostructures, thin film, heterostructures, surfaces, and interfaces.
- OSTI ID:
- 22402466
- Journal Information:
- Applied Physics Letters, Vol. 106, Issue 20; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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