The effect of the solution flow rate on the properties of zinc oxide (ZnO) thin films deposited by ultrasonic spray
- Physics of thin films and applications laboratory, University of biskra, BP 145 RP, 07000 Biskra (Algeria)
In this work, we used a system based on ultrasonic spray pyrolysis technique. By witch, we have deposited thin films of zinc oxide (ZnO) with the variation of solution flow rate from 50 ml / h to 150 ml / h, and set other parameters such as the concentration of the solution, the deposition time, substrate temperature and the nozzel -substrate distance. In order to study the influence of the solution flow rate on the properties of the films produced, we have several characterization techniques such as X-ray diffraction to determine the films structure, the scanning electron microscopy SEM for the morphology of the surfaces, EDS spectroscopy for the chemical composition, UV-Visible-Nir spectroscopy for determination the optical proprieties of thin films.The experimental results show that: the films have hexagonal structure at the type (wurtzite), the average size of grains varies from 20.11 to 32.45 nm, the transmittance of the films equals 80% in visible rang and the band gap is varied between 3.274 and 3.282 eV, when the solution flow rate increases from 50 to 150 ml/h.
- OSTI ID:
- 22391290
- Journal Information:
- AIP Conference Proceedings, Vol. 1653, Issue 1; Conference: APMAS 2014: 4. International Congress in Advances in Applied Physics and Materials Science, Fethiye (Turkey), 24-27 Apr 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSORPTION SPECTROSCOPY
CHEMICAL COMPOSITION
CONCENTRATION RATIO
DEPOSITION
ELECTRONIC STRUCTURE
ENERGY GAP
ENERGY-LOSS SPECTROSCOPY
EV RANGE
FLOW RATE
HEXAGONAL LATTICES
MATHEMATICAL SOLUTIONS
MORPHOLOGY
PYROLYSIS
SCANNING ELECTRON MICROSCOPY
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION
ZINC OXIDES