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Title: Measurement of quasiparticle transport in aluminum films using tungsten transition-edge sensors

We report on experimental studies of phonon sensors which utilize quasiparticle diffusion in thin aluminum films connected to tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach. These studies allow the design of phonon sensors with improved performance.
Authors:
; ; ; ;  [1] ; ;  [2] ; ; ;  [3] ;  [1] ;  [4]
  1. Department of Physics, Stanford University, Stanford, California 94305 (United States)
  2. Department of Physics, Santa Clara University, Santa Clara, California 95053 (United States)
  3. SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States)
  4. (United States)
Publication Date:
OSTI Identifier:
22350990
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM; DIFFUSION; DIFFUSION EQUATIONS; NEUTRAL-PARTICLE TRANSPORT; PULSE SHAPERS; SENSORS; THIN FILMS; TUNGSTEN; X RADIATION