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Title: Spectroscopic ellipsometry study of Cu{sub 2}ZnSnSe{sub 4} bulk crystals

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4892548· OSTI ID:22317993
; ;  [1]; ;  [2];  [3];  [4]; ; ;  [5];  [2];  [6]
  1. Department of Applied Physics M12, Universidad Autónoma de Madrid, Madrid (Spain)
  2. Helmholtz-Zentrum Berlin fuer Materialien und Energie, Berlin (Germany)
  3. Laser Processing Group, Instituto de Optica, CSIC, Serrano 121, 28006 Madrid (Spain)
  4. Department of Chemistry, Belarusian State University of Informatics and Radioelectronics, Minsk (Belarus)
  5. Institute of Applied Physics, Academy of Sciences of Moldova, Chisinau MD 2028 (Moldova, Republic of)
  6. IREC, Catalonia Institute for Energy Research, C. Jardins de les Dones de Negre 1, 08930 Sant Adrià del Besòs (Barcelona) (Spain)

Using spectroscopic ellipsometry we investigated and analyzed the pseudo-optical constants of Cu{sub 2}ZnSnSe{sub 4} bulk crystals, grown by the Bridgman method, over 0.8–4.5 eV photon energy range. The structures found in the spectra of the complex pseudodielectric functions were associated to E{sub 0}, E{sub 1A}, and E{sub 1B} interband transitions and were analyzed in frame of the Adachi's model. The interband transition parameters such as strength, threshold energy, and broadening were evaluated by using the simulated annealing algorithm. In addition, the pseudo-complex refractive index, extinction coefficient, absorption coefficient, and normal-incidence reflectivity were derived over 0.8–4.5 eV photon energy range.

OSTI ID:
22317993
Journal Information:
Applied Physics Letters, Vol. 105, Issue 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English