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Title: Refractive index of r-cut sapphire under shock pressure range 5 to 65 GPa

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4894854· OSTI ID:22314383
; ; ; ; ; ; ;  [1];  [2]
  1. Laboratory for Shock Wave and Detonation Physics, Institute of Fluid Physics, Mianyang, Sichuan 621900 (China)
  2. The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207 (China)

High-pressure refractive index of optical window materials not only can provide information on electronic polarizability and band-gap structure, but also is important for velocity correction in particle-velocity measurement with laser interferometers. In this work, the refractive index of r-cut sapphire window at 1550 nm wavelength was measured under shock pressures of 5–65 GPa. The refractive index (n) decreases linearly with increasing shock density (ρ) for shock stress above the Hugoniot elastic limit (HEL): n = 2.0485 (± 0.0197) − 0.0729 (± 0.0043)ρ, while n remains nearly a constant for elastic shocks. This behavior is attributed to the transition from elastic (below HEL) to heterogeneous plastic deformation (above HEL). Based on the obtained refractive index-density relationship, polarizability of the shocked sapphire was also obtained.

OSTI ID:
22314383
Journal Information:
Journal of Applied Physics, Vol. 116, Issue 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English

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