Measuring the x-ray resolving power of bent potassium acid phthalate diffraction crystals
- National Security Technologies, LLC, Livermore, California 94550 (United States)
- Sandia National Laboratories, Albuquerque, New Mexico 87123 (United States)
This report presents the results from measuring the X-ray resolving power of a curved potassium acid phthalate (KAP(001)) spectrometer crystal using two independent methods. It is part of a continuing effort to measure the fundamental diffraction properties of bent crystals that are used to study various characteristics of high temperature plasmas. Bent crystals like KAP(001) do not usually have the same diffraction properties as corresponding flat crystals. Models that do exist to calculate the effect of bending the crystal on the diffraction properties have simplifying assumptions and their accuracy limits have not been adequately determined. The type of crystals that we measured is being used in a spectrometer on the Z machine at Sandia National Laboratories in Albuquerque, New Mexico. The first technique for measuring the crystal resolving power measures the X-ray spectral line width of the characteristic lines from several metal anodes. The second method uses a diode X-ray source and a double crystal diffractometer arrangement to measure the reflectivity curve of the KAP(001) crystal. The width of that curve is inversely proportional to the crystal resolving power. The measurement results are analyzed and discussed.
- OSTI ID:
- 22308602
- Journal Information:
- Review of Scientific Instruments, Vol. 85, Issue 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
Determining the diffraction properties of a cylindrically bent KAP(001) crystal from 1 to 5 keV
Measurement and models of bent KAP(001) crystal integrated reflectivity and resolution (invited)