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Title: Superconductivity in textured Bi clusters/Bi{sub 2}Te{sub 3} films

We report superconductivity at an onset critical temperature below 3.1 K in topological insulator ∼200-nm-thick Bi{sub 2}Te{sub 3} thin films grown by pulsed laser deposition. Using energy-dispersive X-ray spectroscopy elemental mapping and Auger electron spectroscopy elemental depth profiling, we clearly identified bismuth (Bi) precipitation and Bi cluster signatures. Superconductivity in the Bi{sub 2}Te{sub 3} films was attributed to the proximity effect of Bi clusters precipitated on the surface of the Bi{sub 2}Te{sub 3} films.
Authors:
 [1] ;  [2] ; ; ;  [3] ;  [4] ;  [1]
  1. Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 30049, Taiwan (China)
  2. (Viet Nam)
  3. Department of Electrophysics, National Chiao Tung University, Hsinchu 300, Taiwan (China)
  4. Institute of Physics, National Chiao Tung University, Hsinchu 300, Taiwan (China)
Publication Date:
OSTI Identifier:
22303572
Resource Type:
Journal Article
Resource Relation:
Journal Name: APL Materials; Journal Volume: 2; Journal Issue: 9; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; AUGER ELECTRON SPECTROSCOPY; BISMUTH; BISMUTH TELLURIDES; CRITICAL TEMPERATURE; ENERGY BEAM DEPOSITION; LASER RADIATION; PRECIPITATION; PROXIMITY EFFECT; PULSED IRRADIATION; SUPERCONDUCTIVITY; THIN FILMS; X-RAY SPECTROSCOPY