Interpretation of nanoparticle X-ray photoelectron intensities

Journal Article · Mon Jun 16 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4884065· OSTI ID:22299915

Werner, Wolfgang S. M.,; Chudzicki, Maksymillian; Smekal, Werner ^[1]; Powell, Cedric J. ^[2]

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1. Institute of Applied Physics, Vienna University of Technology, Wiedner Hauptstraße 8-10, A-1040 Vienna (Austria)
2. Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899-8370 (United States)

X-ray photoelectron (XPS) intensities have been simulated for spherical core-shell nanoparticles (NPs) in different geometrical arrangements in order to investigate the validity of commonly made assumptions for the interpretation of XPS NP intensities. The single-sphere approximation is valid for a powder sample when all spatial coordinates of the NP positions are uncorrelated. Correlations along either the depth coordinate or the lateral coordinates lead to features in the angular distribution that provide information on these correlations. The XPS intensity is proportional to the surface-to-volume ratio of nanoparticles but only for NP sizes exceeding the inelastic mean free path of the photoelectrons.

• OSTI ID: 22299915
• Journal Information: Applied Physics Letters, Vol. 104, Issue 24; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
ANGULAR DISTRIBUTION
APPROXIMATIONS
COORDINATES
CORRELATIONS
DEPTH
ELECTRON EMISSION
MEAN FREE PATH
POWDERS
SIMULATION
SPHERES
SPHERICAL CONFIGURATION
SURFACES
X RADIATION
X-RAY PHOTOELECTRON SPECTROSCOPY
NANOPARTICLES