Spatial dependence of polycrystalline FTO’s conductance analyzed by conductive atomic force microscope (C-AFM)

Journal Article · Thu May 15 00:00:00 EDT 2014 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4878274· OSTI ID:22280313

Peixoto, Alexandre Pessoa; Costa, J. C. da ^[1]

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1. Department of Electrical Engineering, University of Brasília, Campus Universitário Darcy Ribeiro, Asa Norte, PO Box 4386, Brasília - DF, 70919-970 (Brazil)

Fluorine-doped Tin oxide (FTO) is a highly transparent, electrically conductive polycrystalline material frequently used as an electrode in organic solar cells and optical-electronic devices [1–2]. In this work a spatial analysis of the conductive behavior of FTO was carried out by Conductive-mode Atomic Force Microscopy (C-AFM). Rare highly oriented grains sample give us an opportunity to analyze the top portion of polycrystalline FTO and compare with the border one. It is shown that the current flow essentially takes place through the polycrystalline edge at grain boundaries.

• OSTI ID: 22280313
• Journal Information: AIP Conference Proceedings, Vol. 1598, Issue 1; Conference: LDSD 2011: 7. international conference on low dimensional structures and devices, Telchac (Mexico), 22-27 May 2011; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
COMPARATIVE EVALUATIONS
DOPED MATERIALS
ELECTRIC CONDUCTIVITY
ELECTRIC CURRENTS
ELECTRODES
FLUORINE
GRAIN BOUNDARIES
ORGANIC SOLAR CELLS
POLYCRYSTALS
SPACE DEPENDENCE
TIN OXIDES