Thermoelectric properties in the series Ti{sub 1-x}Ta{sub x}S{sub 2}

Journal Article · Tue Jan 28 00:00:00 EST 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4863141· OSTI ID:22275648

Beaumale, M.; Barbier, T.; Bréard, Y.; Hébert, S.; Kinemuchi, Y. ^[1]

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1. National Institute of Advanced Industrial Science and Technology (AIST), AIST Chubu, Nagoya 463-8560 (Japan)

Polycrystalline samples in the series Ti{sub 1-x}Ta{sub x}S{sub 2} with x varying from 0 to 1 were prepared using solid-liquid-vapor reaction and spark plasma sintering. Rietveld refinements of X-ray diffraction data are consistent with the existence of a full solid solution for x ≤ 0.4. Transport measurements reveal that tantalum can act as electron donor when substituted in the Ti sites. As a consequence, the electrical resistivity and the absolute value of the Seebeck coefficient decrease with Ta content due to an increase in the carrier concentration. The lattice thermal conductivity being reduced due to mass fluctuation effect, the ZT values in Ti{sub 0.95}Ta{sub 0.05}S{sub 2} is slightly increased as compared to TiS{sub 2}.

• OSTI ID: 22275648
• Journal Information: Journal of Applied Physics, Vol. 115, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BINDING ENERGY
COMPARATIVE EVALUATIONS
CONCENTRATION RATIO
CRYSTAL LATTICES
ELECTRIC CONDUCTIVITY
ELECTRONS
POLYCRYSTALS
SINTERING
SOLID SOLUTIONS
TANTALUM COMPOUNDS
THERMAL CONDUCTIVITY
THERMOELECTRIC PROPERTIES
TITANIUM SULFIDES
VAPORS
X-RAY DIFFRACTION