skip to main content

SciTech ConnectSciTech Connect

Title: Thermoelectric properties in the series Ti{sub 1-x}Ta{sub x}S{sub 2}

Polycrystalline samples in the series Ti{sub 1-x}Ta{sub x}S{sub 2} with x varying from 0 to 1 were prepared using solid-liquid-vapor reaction and spark plasma sintering. Rietveld refinements of X-ray diffraction data are consistent with the existence of a full solid solution for x ≤ 0.4. Transport measurements reveal that tantalum can act as electron donor when substituted in the Ti sites. As a consequence, the electrical resistivity and the absolute value of the Seebeck coefficient decrease with Ta content due to an increase in the carrier concentration. The lattice thermal conductivity being reduced due to mass fluctuation effect, the ZT values in Ti{sub 0.95}Ta{sub 0.05}S{sub 2} is slightly increased as compared to TiS{sub 2}.
Authors:
; ; ; ;  [1] ;  [2]
  1. Laboratoire CRISMAT, UMR 6508 CNRS ENSICAEN, 6 bd Maréchal Juin, 14050 CAEN Cedex 4 (France)
  2. National Institute of Advanced Industrial Science and Technology (AIST), AIST Chubu, Nagoya 463-8560 (Japan)
Publication Date:
OSTI Identifier:
22275648
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BINDING ENERGY; COMPARATIVE EVALUATIONS; CONCENTRATION RATIO; CRYSTAL LATTICES; ELECTRIC CONDUCTIVITY; ELECTRONS; POLYCRYSTALS; SINTERING; SOLID SOLUTIONS; TANTALUM COMPOUNDS; THERMAL CONDUCTIVITY; THERMOELECTRIC PROPERTIES; TITANIUM SULFIDES; VAPORS; X-RAY DIFFRACTION