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Title: AlN/Fe/AlN nanostructures for magnetooptic magnetometry

AlN/Fe/AlN/Cu nanostructures with ultrathin Fe grown by sputtering on Si substrates are evaluated as probes for magnetooptical (MO) mapping of weak currents. They are considered for a laser wavelength of λ = 410 nm (3.02 eV) and operate at oblique light incidence angles, φ{sup (0)}, to enable detection of both in-plane and out-of-plane magnetization. Their performance is evaluated in terms of MO reflected wave electric field amplitudes. The maximal MO amplitudes in AlN/Fe/AlN/Cu are achieved by a proper choice of layer thicknesses. The nanostructures were characterized by MO polar Kerr effect at φ{sup (0)} ≈ 5° and longitudinal Kerr effect spectra (φ{sup (0)} = 45°) at photon energies between 1 and 5 eV. The nominal profiles were refined using a model-based analysis of the spectra. Closed form analytical expressions are provided, which are useful in the search for maximal MO amplitudes.
Authors:
;  [1] ; ; ;  [2] ; ;  [3]
  1. Faculty of Mathematics and Physics, Charles University in Prague, Ke Karlovu 5, 12116 Prague 2 (Czech Republic)
  2. Nanotechnology Center, Technical University of Ostrava, 17. listopadu 15/2172, 70833 Ostrava Poruba (Czech Republic)
  3. Center for Magnetism and Magnetic Nanostructures, University of Colorado at Colorado Springs, 1420 Austin Bluffs Pkwy., Colorado Springs, Colorado 80918 (United States)
Publication Date:
OSTI Identifier:
22273739
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; ALUMINIUM NITRIDES; COPPER; ELECTRIC CURRENTS; ELECTRIC FIELDS; ENERGY SPECTRA; HETEROJUNCTIONS; INCIDENCE ANGLE; INTERFACES; IRON; KERR EFFECT; LAYERS; MAGNETIZATION; MAGNETO-OPTICAL EFFECTS; NANOSTRUCTURES; SILICON; SUBSTRATES