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Title: Thermal stability of partially ordered Fe{sub 16}N{sub 2} film on non-magnetic Ag under layer

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4869065· OSTI ID:22273728
;  [1]; ;  [1];  [2]
  1. The Center for Micromagnetics and Information Technologies (MINT) and Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455 (United States)
  2. High Temperature Materials Laboratory, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

Partially ordered Fe{sub 16}N{sub 2} thin film with (001) texture is successfully grown on a Ag under layer using a facing target sputtering system. Fe{sub 16}N{sub 2} phase is formed after post-annealing, which is detected by X-ray diffraction (XRD). High saturation magnetization (M{sub s}) of Fe{sub 16}N{sub 2} thin films is observed by vibrating sample magnetometry. It is found that Fe{sub 16}N{sub 2} phase can be stable up to 225 °C, which is demonstrated by the Fe{sub 16}N{sub 2} finger print peak (002) in XRD. After heating to 250 °C, the Fe{sub 16}N{sub 2} phase decomposes, which leads to low M{sub s} and soft magnetic behavior. To further study Fe{sub 16}N{sub 2} decomposition, X-ray photoelectron spectroscopy is performed to detect the binding energy of nitrogen atoms. Differences of binding energy corresponding to before and after heat treatment show the variation of nitrogen atom in electronic state with surrounding Fe atoms, indicating nitrogen atomic migration during heat treatment.

OSTI ID:
22273728
Journal Information:
Journal of Applied Physics, Vol. 115, Issue 17; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English