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Title: Enhancement in field emission current density of Ni nanoparticles embedded in thin silica matrix by swift heavy ion irradiation

The field emission (FE) properties of nickel nanoparticles embedded in thin silica matrix irradiated with 100 MeV Au{sup +7} ions at various fluences are studied here. A large increase in FE current density is observed in the irradiated films as compared to their as deposited counterpart. The dependence of FE properties on irradiation fluence is correlated with surface roughness, density of states of valence band and size distribution of nanoparticles as examined with atomic force microscope, X-ray photoelectron spectroscopy, and grazing incidence small angle x-ray scattering. A current density as high as 0.48 mA/cm{sup 2} at an applied field 15 V/μm has been found for the first time for planar field emitters in the film irradiated with fluence of 5.0 × 10{sup 13} ions/cm{sup 2}. This significant enhancement in the current density is attributed to an optimized size distribution along with highest surface roughness of the same. This new member of field emission family meets most of the requirements of cold cathodes for vacuum micro/nanoelectronic devices.
Authors:
; ; ;  [1] ;  [1] ;  [2] ; ;  [3] ; ;  [4]
  1. Nanostech Laboratory, Department of Physics, Indian Institute of Technology Delhi, New Delhi 110016 (India)
  2. (Brazil)
  3. Inter University Accelerator Centre, New Delhi 110067 (India)
  4. DESY, Petra III, Hamburg (Germany)
Publication Date:
OSTI Identifier:
22273478
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 115; Journal Issue: 17; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 77 NANOSCIENCE AND NANOTECHNOLOGY; ATOMIC FORCE MICROSCOPY; COMPARATIVE EVALUATIONS; CURRENT DENSITY; ENERGY-LEVEL DENSITY; FIELD EMISSION; GOLD IONS; IRRADIATION; MATRIX MATERIALS; NANOSTRUCTURES; NICKEL; PARTICLES; ROUGHNESS; SILICA; SMALL ANGLE SCATTERING; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY