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Title: 100 MeV O{sup 7+} irradiation induced red shift in the band gaps of 3 wt% 'Li' doped Nb{sub 2}O{sub 5} thin film

Nb{sub 2}O{sub 5}:Li (3 wt%) thin film of thickness 353 nm spray deposited onto ITO coated glass substrate at 350 °C is irradiated with 100 MeV O{sup 7+} ion at a fluence of 5×10{sup 12} ions/cm{sup 2}. X-ray diffraction shows that the pristine and irradiated films are polycrystalline with a tetragonal phase. Raman peaks suppressed upon irradiation imply large surface degradation which is also seen as a decrement in transparency in visible region to one half of the pristine film. Large red shift is observed in direct and indirect band gaps upon irradiation. Hall effect reveals slight increase in carrier concentration due to irradiation induced defects.
Authors:
;  [1] ;  [2] ; ;  [3] ;  [4] ;  [5]
  1. Department of Physics, Presidency College, Chennai - 600005 (India)
  2. Center for Condensed Matter Sciences, National Taiwan University, Taipei - 10617, Taiwan (China)
  3. Department of Nuclear Physics, University of Madras, Guindy Campus, Chennai - 600025 (India)
  4. Department of Physics and Astrophysics, University of Delhi, Delhi 110007 (India)
  5. Interuniversity Accelerator Centre, Aruna Asaf Ali Marg, New Delhi, 110067 (India)
Publication Date:
OSTI Identifier:
22271054
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1591; Journal Issue: 1; Conference: 58. DAE solid state physics symposium 2013, Patiala, Punjab (India), 17-21 Dec 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CONCENTRATION RATIO; DOPED MATERIALS; HALL EFFECT; ION BEAMS; IRRADIATION; LITHIUM COMPOUNDS; MEV RANGE; MULTICHARGED IONS; NIOBIUM OXIDES; OXYGEN IONS; PHYSICAL RADIATION EFFECTS; POLYCRYSTALS; RAMAN SPECTROSCOPY; RED SHIFT; SUBSTRATES; SURFACES; THIN FILMS; X-RAY DIFFRACTION