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Title: Thickness dependent functional properties of PbZr{sub 0.52}Ti{sub 0.48}O{sub 3}/La{sub 0.67}Sr{sub 0.33}MnO{sub 3} heterostructures

The ultra thin ferroelectric PbZr{sub 0.52}Ti{sub 0.48}O{sub 3} (PZT) films with various thicknesses ranging from 100 (P100) to 10 (P10) nm were grown on La{sub 0.67}Sr{sub 0.33}MnO{sub 3}/(LaAlO{sub 3}){sub 0.3}(Sr{sub 2}AlTaO{sub 6}){sub 0.7} (LSMO/LSAT) (001) substrates deposited by pulsed laser deposition technique. The x-ray diffraction patterns of the heterostructures show only (00l) (l = 1 and/or 2) reflections corresponding to the LSAT substrate, PZT, and LSMO layers. The atomic force microscopy studies show that the root mean square surface roughnesses of P100 and P10 films are 2.39 and 0.99 nm, respectively. An increase of both real (ε′) and imaginary (ε″) permittivities was observed when thickness of PZT increases from 10 nm to 100 nm. Temperature dependent ε′ presents an anomaly, related to ferromagnetic-metal to paramagnetic-insulator transition of the LSMO, in the range of 350–500 K. The dielectric anomalies and magnetic phase transition temperature shifted to the lower temperature values with decrease in the PZT films thicknesses. The values of the remanent polarization (P{sub r}) and coercive field (E{sub c}) of the heterostructures were in the range of 24–42 μC/cm{sup 2}–170–1300 kV/cm. An appreciable increase of saturated magnetization (M{sub s}) was observed with increase of PZT layer thickness. The average M{sub s} values of PZT/LSMO heterostructure were 170, 150,more » 100, and 45 emu/cm{sup 3} for 100, 50, 25, and 10 nm at 300 K, respectively. Enhancement in magnetization with increase in PZT thickness may be due to the interface effect between PZT/LSMO layers.« less
Authors:
; ;  [1] ;  [2] ;  [3] ;  [1] ;  [4]
  1. Department of Physics and Institute of Functional Nanomaterials, University of Puerto Rico, San Juan, Puerto Rico 00931-3343 (United States)
  2. National Physical Laboratory (CSIR), Dr. K. S. Krishnan Road, New Delhi 110012 (India)
  3. Indian Institute of Technology, Hauz Khas, New Delhi (India)
  4. (United Kingdom)
Publication Date:
OSTI Identifier:
22266198
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 114; Journal Issue: 23; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINATES; ENERGY BEAM DEPOSITION; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; LASER RADIATION; MAGNETIZATION; METALS; MICROSCOPY; PARAMAGNETISM; PERMITTIVITY; PHASE TRANSFORMATIONS; POLARIZATION; PULSED IRRADIATION; PZT; REFLECTION; ROUGHNESS; SUBSTRATES; TEMPERATURE DEPENDENCE; THICKNESS; TRANSITION TEMPERATURE; X-RAY DIFFRACTION