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Title: Fabrication of fine-grain tantalum diffusion barrier tube for Nb{sub 3}Sn conductors

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4860625· OSTI ID:22264040
; ; ;  [1]; ;  [2]
  1. Department of Mechanical Engineering, Texas A and M University, TX 77843 (United States)
  2. Shear Form Inc, 207 Dellwood St, Bryan 77801 (United States)

Diffusion barriers used in Nb{sub 3}Sn wire are often fabricated by wrapping Ta sheet into a tube with an overlap seam. A common result of such practice is non-uniform deformation in the Ta sheet as it thins by wire drawing because of non-uniform grain size and texture in the original Ta sheet. Seamless Ta tube with a fine-grain and uniform microstructure would be much better for the diffusion barrier application, but such material is expensive and difficult to manufacture. This report presents results on a new fabrication strategy for Ta tube that shows promise for manufacture of less costly tube with an improved microstructure. The fabrication method begins with seam-welded tube but gives a fine-grain uniform microstructure with little difference between the longitudinal seam weld region and the parent metal after post-weld processing. Severe plastic deformation processing (SPD) applied by area reduction extrusion and tube equal channel angular extrusion (tECAE) are used to refine and homogenize the microstructure. Microstructure and mechanical property results are presented for Ta tubes fabricated by this new processing strategy.

OSTI ID:
22264040
Journal Information:
AIP Conference Proceedings, Vol. 1574, Issue 1; Conference: International cryogenic materials conference, Anchorage, AK (United States), 17-21 Jun 2013; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English

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