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Title: Numerical simulation of ion charge breeding in electron beam ion source

The Electron Beam Ion Source particle-in-cell code (EBIS-PIC) tracks ions in an EBIS electron beam while updating electric potential self-consistently and atomic processes by the Monte Carlo method. Recent improvements to the code are reported in this paper. The ionization module has been improved by using experimental ionization energies and shell effects. The acceptance of injected ions and the emittance of extracted ion beam are calculated by extending EBIS-PIC to the beam line transport region. An EBIS-PIC simulation is performed for a Cs charge-breeding experiment at BNL. The charge state distribution agrees well with experiments, and additional simulation results of radial profiles and velocity space distributions of the trapped ions are presented.
Authors:
;  [1]
  1. FAR-TECH, Inc., San Diego, California 92122 (United States)
Publication Date:
OSTI Identifier:
22253850
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 2; Conference: ICIS 2011: 14. international conference on ion sources, Giardini-Naxos, Sicily (Italy), 12-16 Sep 2011; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BNL; BREEDING; CHARGE STATES; COMPUTERIZED SIMULATION; ELECTRIC POTENTIAL; ELECTRON BEAM ION SOURCES; ELECTRON BEAMS; ION BEAMS; IONIZATION; MONTE CARLO METHOD; PARTICLE TRACKS