Unexpected behaviour of one Pb monolayer deposited on aluminum oxide thin film grown on Ag(111)

Journal Article · Mon Dec 23 00:00:00 EST 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4855575· OSTI ID:22253204

Vizzini, Sébastien; Bertoglio, M. ^[1]; Oughaddou, Hamid ^[2]; Hoarau, J. Y.; Biberian, J. P.; Aufray, B. ^[3]

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1. IM2NP CNRS, Aix Marseille Université, F-13397 Marseille (France)
2. Institut des Sciences Moléculaires d'Orsay, ISMO CNRS, Université de Paris, F-91405 Orsay, France and Deptartamento de Physique, Université de Cergy-Pontoise, F-95031 Cergy-Pontoise (France)
3. CINaM CNRS, Aix Marseille Université, F-13288 Marseille (France)

Using scanning tunneling microscopy (STM), Auger electron spectroscopy, and low energy electron diffraction, we have observed a surprising complete dissolution at room temperature of one lead monolayer deposited by evaporation on an aluminum oxide thin film (∼0.8 nm thick) previously grown on Ag (111). We have observed the quasi-instantaneous diffusion of the lead deposit through the oxide layer to the silver/oxide interface. After the diffusion process, lead atoms form a Moiré superstructure, which is characterized by STM through the oxide layer. This unexpected behavior puts in light the very weak interaction between the aluminum oxide and the silver substrate.

• OSTI ID: 22253204
• Journal Information: Applied Physics Letters, Vol. 103, Issue 26; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALUMINIUM OXIDES
AUGER ELECTRON SPECTROSCOPY
DEPOSITS
ELECTRON DIFFRACTION
LEAD
SCANNING TUNNELING MICROSCOPY
SILVER
SILVER OXIDES
THIN FILMS