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Title: Thermal conductivity of sputtered amorphous Ge films

We measured the thermal conductivity of amorphous Ge films prepared by magnetron sputtering. The thermal conductivity was significantly higher than the value predicted by the minimum thermal conductivity model and increased with deposition temperature. We found that variations in sound velocity and Ge film density were not the main factors in the high thermal conductivity. Fast Fourier transform patterns of transmission electron micrographs revealed that short-range order in the Ge films was responsible for their high thermal conductivity. The results provide experimental evidences to understand the underlying nature of the variation of phonon mean free path in amorphous solids.
Authors:
; ; ; ; ; ;  [1]
  1. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047 (Japan)
Publication Date:
OSTI Identifier:
22251232
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 4; Journal Issue: 2; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; DEPOSITION; FILMS; FOURIER TRANSFORMATION; MAGNETRONS; MEAN FREE PATH; SOLIDS; SPUTTERING; THERMAL CONDUCTIVITY