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Title: An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers

We present a Michelson interferometer for 13.5 nm soft x-ray radiation. It is characterized in a proof-of-principle experiment using synchrotron radiation, where the temporal coherence is measured to be 13 fs. The curvature of the thin-film beam splitter membrane is derived from the observed fringe pattern. The applicability of this Michelson interferometer at intense free-electron lasers is investigated, particularly with respect to radiation damage. This study highlights the potential role of such Michelson interferometers in solid density plasma investigations using, for instance, extreme soft x-ray free-electron lasers. A setup using the Michelson interferometer for pseudo-Nomarski-interferometry is proposed.
Authors:
; ; ;  [1] ;  [2] ;  [3] ; ; ; ; ;  [1] ;  [4]
  1. Institute of Optics and Quantum Electronics, Friedrich-Schiller University Jena, Max-Wien-Platz 1, 07743 Jena (Germany)
  2. Institute for Theoretical Physics, Friedrich-Schiller University Jena, Max-Wien-Platz 1, 07743 Jena (Germany)
  3. Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Straße 7, 07745 Jena (Germany)
  4. (Germany)
Publication Date:
OSTI Identifier:
22220358
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 84; Journal Issue: 9; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BEAMS; EXTREME ULTRAVIOLET RADIATION; FREE ELECTRON LASERS; INTERFEROMETRY; MEMBRANES; MICHELSON INTERFEROMETER; PLASMA DENSITY; PLASMA DIAGNOSTICS; RADIATION EFFECTS; SOFT X RADIATION; SYNCHROTRON RADIATION; THIN FILMS