An extreme ultraviolet Michelson interferometer for experiments at free-electron lasers
- Institute of Optics and Quantum Electronics, Friedrich-Schiller University Jena, Max-Wien-Platz 1, 07743 Jena (Germany)
- Institute for Theoretical Physics, Friedrich-Schiller University Jena, Max-Wien-Platz 1, 07743 Jena (Germany)
- Fraunhofer Institute for Applied Optics and Precision Engineering, Albert-Einstein-Straße 7, 07745 Jena (Germany)
We present a Michelson interferometer for 13.5 nm soft x-ray radiation. It is characterized in a proof-of-principle experiment using synchrotron radiation, where the temporal coherence is measured to be 13 fs. The curvature of the thin-film beam splitter membrane is derived from the observed fringe pattern. The applicability of this Michelson interferometer at intense free-electron lasers is investigated, particularly with respect to radiation damage. This study highlights the potential role of such Michelson interferometers in solid density plasma investigations using, for instance, extreme soft x-ray free-electron lasers. A setup using the Michelson interferometer for pseudo-Nomarski-interferometry is proposed.
- OSTI ID:
- 22220358
- Journal Information:
- Review of Scientific Instruments, Vol. 84, Issue 9; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BEAMS
EXTREME ULTRAVIOLET RADIATION
FREE ELECTRON LASERS
INTERFEROMETRY
MEMBRANES
MICHELSON INTERFEROMETER
PLASMA DENSITY
PLASMA DIAGNOSTICS
RADIATION EFFECTS
SOFT X RADIATION
SYNCHROTRON RADIATION
THIN FILMS