Optical designs of reflection and refraction collection optics for a JT-60SA core Thomson scattering system
- Japan Atomic Energy Agency, 801-1 Mukoyama, Naka 311-0193 (Japan)
Collection optics for core measurements in a JT-60SA Thomson scattering system were designed. The collection optics will be installed in a limited space and have a wide field of view and wide wavelength range. Two types of the optics are therefore suggested: refraction and reflection types. The reflection system, with a large primary mirror, avoids large chromatic aberrations. Because the size limit of the primary mirror and vignetting due to the secondary mirror affect the total collection throughput, conditions that provide the high throughput are found through an optimization. A refraction system with four lenses forming an Ernostar system is also employed. The use of high-refractive-index glass materials enhances the freedom of the lens curvatures, resulting in suppression of the spherical and coma aberration. Moreover, sufficient throughput can be achieved, even with smaller lenses than that of a previous design given in [H. Tojo, T. Hatae, T. Sakuma, T. Hamano, K. Itami, Y. Aida, S. Suitoh, and D. Fujie, Rev. Sci. Instrum. 81, 10D539 (2010)]. The optical resolutions of the reflection and refraction systems are both sufficient for understanding the spatial structures in plasma. In particular, the spot sizes at the image of the optics are evaluated as ∼0.3 mm and ∼0.4 mm, respectively. The throughput for the two systems, including the pupil size and transmissivity, are also compared. The results show that good measurement accuracy (<10%) even at high electron temperatures (<30 keV) can be expected in the refraction system.
- OSTI ID:
- 22220347
- Journal Information:
- Review of Scientific Instruments, Vol. 84, Issue 9; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ACCURACY
CHROMATIC ABERRATIONS
DESIGN
ELECTRON TEMPERATURE
ION TEMPERATURE
LENSES
MIRRORS
OPTICS
PLASMA DIAGNOSTICS
REFLECTION
REFRACTION
REFRACTIVE INDEX
SPHERICAL CONFIGURATION
THOMSON SCATTERING
WAVELENGTHS