Femtosecond x-ray absorption spectroscopy with hard x-ray free electron laser

Journal Article · Mon Sep 23 00:00:00 EDT 2013 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4821108· OSTI ID:22217965

Katayama, Tetsuo; Togashi, Tadashi; Tono, Kensuke; Kameshima, Takashi ^[1]; Inubushi, Yuichi; Sato, Takahiro; Hatsui, Takaki; Yabashi, Makina ^[2]; Obara, Yuki; Misawa, Kazuhiko ^[3]; Bhattacharya, Atanu; Kurahashi, Naoya ^[4]; Ogi, Yoshihiro ^[5]; Suzuki, Toshinori ^[4]

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1. Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198 (Japan)
2. RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)
3. Department of Applied Physics, Tokyo University of Agriculture and Technology, 2-24-16 Naka-cho, Koganei, Tokyo 184-8588 (Japan)
4. Department of Chemistry, Graduate School of Science, Kyoto University, Kitashirakawa-Oiwakecho, Sakyo-ku, Kyoto 606-8502 (Japan)
5. Molecular Reaction Dynamics Research Team, RIKEN Center for Advanced Photonics, 2-1 Hirosawa, Wako 351-0198 (Japan)

We have developed a method of dispersive x-ray absorption spectroscopy with a hard x-ray free electron laser (XFEL), generated by a self-amplified spontaneous emission (SASE) mechanism. A transmission grating was utilized for splitting SASE-XFEL light, which has a relatively large bandwidth (ΔE/E ∼ 5 × 10{sup −3}), into several branches. Two primary split beams were introduced into a dispersive spectrometer for measuring signal and reference spectra simultaneously. After normalization, we obtained a Zn K-edge absorption spectrum with a photon-energy range of 210 eV, which is in excellent agreement with that measured by a conventional wavelength-scanning method. From the analysis of the difference spectra, the noise ratio was evaluated to be ∼3 × 10{sup −3}, which is sufficiently small to trace minute changes in transient spectra induced by an ultrafast optical laser. This scheme enables us to perform single-shot, high-accuracy x-ray absorption spectroscopy with femtosecond time resolution.

• OSTI ID: 22217965
• Journal Information: Applied Physics Letters, Vol. 103, Issue 13; Other Information: (c) 2013 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ABSORPTION SPECTRA
ABSORPTION SPECTROSCOPY
ACCURACY
BEAMS
DIFFRACTION GRATINGS
EV RANGE
FREE ELECTRON LASERS
HARD X RADIATION
NOISE
PHOTONS
SIGNALS
SPECTROMETERS
SUPERRADIANCE
TIME RESOLUTION
TRANSIENTS
X-RAY LASERS
X-RAY SPECTROSCOPY