Simulation of the generation of the characteristic X-ray emission by hot electrons in a foil

Journal Article · Sun Mar 31 00:00:00 EDT 2013 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QE2013V043N03ABEH015102· OSTI ID:22113725

Kostenko, O F; Andreev, N E ^[1]

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1. Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow (Russian Federation)

We have developed a model to calculate the yield of the characteristic X-ray radiation from a foil, taking into account the dependence of the average energy and the number of hot electrons on the intensity of the laser pulse, the self-absorption of X-rays and the effect of refluxing of hot electrons. The yield of K{sub {alpha}} radiation from a silver foil is optimised at relativistic intensities. A method is proposed for diagnosing the effect of electron refluxing, which greatly increases the yield of K{sub {alpha}} radiation. (extreme light fields and their applications)

• OSTI ID: 22113725
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Vol. 43, Issue 3; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7818
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
COMPUTERIZED SIMULATION
ELECTRONS
EMISSION
FOILS
LASERS
PULSES
RELATIVISTIC RANGE
SELF-ABSORPTION
SILVER
X RADIATION