A probabilistic model for the identification of confinement regimes and edge localized mode behavior, with implications to scaling laws
Journal Article
·
· Review of Scientific Instruments
- Department of Applied Physics, Ghent University, 9000 Gent (Belgium)
Pattern recognition is becoming an important tool in fusion data analysis. However, fusion diagnostic measurements are often affected by considerable statistical uncertainties, rendering the extraction of useful patterns a significant challenge. Therefore, we assume a probabilistic model for the data and perform pattern recognition in the space of probability distributions. We show the considerable advantage of our method for identifying confinement regimes and edge localized mode behavior, and we discuss the potential for scaling laws.
- OSTI ID:
- 22093857
- Journal Information:
- Review of Scientific Instruments, Vol. 83, Issue 10; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
Similar Records
Impurity confinement and transport in high confinement regimes without edge localized modes on DIII-D
Edge energy transport barrier and turbulence in the I-mode regime on Alcator C-Mod
Impurity confinement and transport in high confinement regimes without edge localized modes on DIII-D [Impurity confinement and transport in high confinement regimes without ELMs on DIII-D]
Journal Article
·
Fri May 15 00:00:00 EDT 2015
· Physics of Plasmas
·
OSTI ID:22093857
+10 more
Edge energy transport barrier and turbulence in the I-mode regime on Alcator C-Mod
Journal Article
·
Sun May 15 00:00:00 EDT 2011
· Physics of Plasmas
·
OSTI ID:22093857
+13 more
Impurity confinement and transport in high confinement regimes without edge localized modes on DIII-D [Impurity confinement and transport in high confinement regimes without ELMs on DIII-D]
Journal Article
·
Fri Apr 17 00:00:00 EDT 2015
· Physics of Plasmas
·
OSTI ID:22093857
+11 more