Study of complex impedance spectroscopic properties of Na{sub 2}Pb{sub 2}Pr{sub 2}W{sub 2}Ti{sub 4}Nb{sub 4}O{sub 30} Ceramic
- Department of Physics, SOT, KIIT University, Bhubaneswar-751 024, Odisha (India) and School of Physics, Sambalpur University, Jyoti Vihar, Burla-768 019, Odisha (India)
The polycrystalline sample of Na{sub 2}Pb{sub 2}Pr{sub 2}W{sub 2}Ti{sub 4}Nb{sub 4}O{sub 30} was prepared by high temperature solid state reaction technique. The formation of compounds with an orthorhombic structure was confirmed by X-ray diffraction technique. Surface morphology study showed homogenous distribution of plate and rod like grains over the entire surface with less porosity. The study of effect of temperature on impedance parameters in the frequency range 10{sup 2}-10{sup 6} Hz and temperature range 30-500 Degree-Sign C revealed the presence of both bulk and grain boundary effects above 275 Degree-Sign C. The bulk resistance of the material decreased with rise in temperature exhibiting a typical negative temperature coefficient of resistance (NTCR) behavior like a semiconductor. Both the complex impedance and modulus studies suggested the presence of non-Debye type of relaxation in the materials. The ac conductivity spectrum obeys Johnsche's universal power law.
- OSTI ID:
- 22069096
- Journal Information:
- AIP Conference Proceedings, Vol. 1461, Issue 1; Conference: IWFM-2011: International workshop on functional materials, Berhampur, Odisha (India), 20-22 Dec 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CERAMICS
ELECTRIC CONDUCTIVITY
GRAIN BOUNDARIES
IMPEDANCE
LEAD COMPOUNDS
MORPHOLOGY
NIOBATES
ORTHORHOMBIC LATTICES
PERMITTIVITY
POLYCRYSTALS
POROSITY
PRASEODYMIUM COMPOUNDS
SEMICONDUCTOR MATERIALS
SODIUM COMPOUNDS
SURFACES
TEMPERATURE DEPENDENCE
TITANIUM COMPOUNDS
TUNGSTEN COMPOUNDS
X-RAY DIFFRACTION