The effect of exit beam phase aberrations on parallel beam coherent x-ray reconstructions

Journal Article · Wed Dec 15 04:00:00 UTC 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3514085· OSTI ID:22062221

Hruszkewycz, S O; Fuoss, P H ^[1]; Harder, R; Xiao, X ^[2]

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1. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. X-Ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Diffraction artifacts from imperfect x-ray windows near the sample are an important consideration in the design of coherent x-ray diffraction measurements. In this study, we used simulated and experimental diffraction patterns in two and three dimensions to explore the effect of phase imperfections in a beryllium window (such as a void or inclusion) on the convergence behavior of phasing algorithms and on the ultimate reconstruction. A predictive relationship between beam wavelength, sample size, and window position was derived to explain the dependence of reconstruction quality on beryllium defect size. Defects corresponding to this prediction cause the most damage to the sample exit wave and induce signature error oscillations during phasing that can be used as a fingerprint of experimental x-ray window artifacts. The relationship between x-ray window imperfection size and coherent x-ray diffractive imaging reconstruction quality explored in this work can play an important role in designing high-resolution in situ coherent imaging instrumentation and will help interpret the phasing behavior of coherent diffraction measured in these in situ environments.

• OSTI ID: 22062221
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 12 Vol. 81; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALGORITHMS
BEAMS
BERYLLIUM
CONVERGENCE
DAMAGE
DEFECTS
DESIGN
IMAGES
RESOLUTION
SIMULATION
WAVELENGTHS
WINDOWS
X RADIATION
X-RAY DIFFRACTION