A simple hard x-ray ''nanoslit'' for measuring wavefront intensity

Journal Article · Thu Jul 15 00:00:00 EDT 2010 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3456447· OSTI ID:22053791

Takano, Hidekazu; Hashimoto, Takuto; Tsuji, Takuya; Koyama, Takahisa; Tsusaka, Yoshiyuki; Kagoshima, Yasushi ^[1]

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1. Graduate School of Material Science, University of Hyogo, Kouto 3-2-1, Hyogo 678-1297 (Japan)

A new method is proposed for nanoscale hard x-ray measurements. This method uses a reflection on a heavy-metal wire that functions as a single slit with a nanoscale aperture for a parallel x-ray beam. This ''nanoslit'' can be used to perform high-spatial-resolution measurements of the intensity distribution of a wavefront that diverges from an aperture. In experiments, Fresnel fringes generated by a rectangular aperture were measured using a 300-{mu}m-diameter platinum wire as the nanoslit. In these experiments, the finest fringes with a period of 26 nm could be successfully resolved.

• OSTI ID: 22053791
• Journal Information: Review of Scientific Instruments, Vol. 81, Issue 7; Other Information: (c) 2010 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
77 NANOSCIENCE AND NANOTECHNOLOGY
APERTURES
FRESNEL REFLECTORS
HARD X RADIATION
HEAVY METALS
NANOSTRUCTURES
PHOTON BEAMS
PLATINUM
REFLECTION
SPATIAL RESOLUTION
WAVE PROPAGATION
WIRES