A fast, direct x-ray detection charge-coupled device

Journal Article · Sat Aug 15 00:00:00 EDT 2009 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.3187222· OSTI ID:22051014

Denes, P; Doering, D; Walder, J -P ^[1]; Padmore, H A ^[2]; Weizeorick, J ^[3]

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1. Engineering Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720 (United States)
2. Advanced Light Source Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd., Berkeley, California 94720 (United States)
3. X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Ave., Argonne, Illinois 60439 (United States)

A charge-coupled device (CCD) capable of 200 Mpixels/s readout has been designed and fabricated on thick, high-resistivity silicon. The CCDs, up to 600 {mu}m thick, are fully depleted, ensuring good infrared to x-ray detection efficiency, together with a small point spread function. High readout speed, with good analog performance, is obtained by the use of a large number of parallel output ports. A set of companion 16-channel custom readout integrated circuits, capable of 15 bits of dynamic range, is used to read out the CCD. A gate array-controlled back end data acquisition system frames and transfers images, as well as provides the CCD clocks.

• OSTI ID: 22051014
• Journal Information: Review of Scientific Instruments, Vol. 80, Issue 8; Other Information: (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGE-COUPLED DEVICES
DATA ACQUISITION SYSTEMS
EFFICIENCY
INTEGRATED CIRCUITS
PERFORMANCE
READOUT SYSTEMS
SILICON
TRANSFER FUNCTIONS
X-RAY DETECTION