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Title: Experimental evaluation of the carrier lifetime in GaAs grown at low temperature

Journal Article · · Semiconductors
 [1];  [2]
  1. St. Petersburg State University (Physics Faculty) (Russian Federation)
  2. St. Petersburg State Polytechnic University (Russian Federation)

The relaxation dynamics of nonequilibrium charge carriers in gallium arsenide epitaxial films grown by molecular-beam epitaxy at low temperatures has been studied. The growth conditions of the epitaxial layer provided an excess arsenic content of 1.2% in the layer. In a material of this kind, the carrier lifetime is <1 ps. To examine carrier relaxation in the femtosecond range, an original scheme for measuring the refractive index dynamics was developed on the basis of the pump-probe technique. The lifetime of nonequilibrium charge carriers was evaluated to be (200 {+-} 35) fs.

OSTI ID:
22038983
Journal Information:
Semiconductors, Vol. 46, Issue 5; Other Information: Copyright (c) 2012 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7826
Country of Publication:
United States
Language:
English