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Title: SeDA: A software package for the statistical analysis of the instrument drift

Conference ·
OSTI ID:22030089
;  [1];  [2]
  1. Korea Atomic Energy Research Inst., 150 Duckjin-dong, Yuseong-gu, Daejeon, 305-353 (Korea, Republic of)
  2. Soong-Sil Univ., 1-1 Sangdo 5-dong, Dongjak-gu, Seoul, 156-743 (Korea, Republic of)

The setpoints for safety-related equipment are affected by many sources of an uncertainty. ANSI/ISA-S67.04.01-2000 [1] and ISA-RP6 7.04.02-2000 [2] suggested the statistical approaches for ensuring that the safety-related instrument setpoints were established and maintained within the technical specification limits [3]. However, Jang et al. [4] indicated that the preceding methodologies for a setpoint drift analysis might be insufficient to manage a setpoint drift on an instrumentation device and proposed new statistical analysis procedures for the management of a setpoint drift, based on the plant specific as-found/as-left data. Although IHPA (Instrument History Performance Analysis) is a widely known commercial software package to analyze an instrument setpoint drift, several steps in the new procedure cannot be performed by using it because it is based on the statistical approaches suggested in the ANSI/ISA-S67.04.01 -2000 [1] and ISA-RP67.04.02-2000 [2], In this paper we present a software package (SeDA: Setpoint Drift Analysis) that implements new methodologies, and which is easy to use, as it is accompanied by powerful graphical tools. (authors)

Research Organization:
American Nuclear Society, 555 North Kensington Avenue, La Grange Park, IL 60526 (United States)
OSTI ID:
22030089
Resource Relation:
Conference: NPIC and HMIT 2006: 5. International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology, Albuquerque, NM (United States), 12-16 Nov 2006; Other Information: Country of input: France; 15 refs.; Related Information: In: Proceedings of the 5. International Topical Meeting on Nuclear Plant Instrumentation Controls, and Human Machine Interface Technology| 1430 p.
Country of Publication:
United States
Language:
English