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Title: Strong circular photogalvanic effect in ZnO epitaxial films

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3666571· OSTI ID:21612434
; ; ;  [1]; ;  [2];  [3]
  1. State Key Laboratory of Artificial Microstructure and Mesoscopic Physics, School of Physics, Peking University, Beijing 100871 (China)
  2. Laboratory of Semiconductor Materials Science, Institute of Semiconductors, CAS, Beijing 100083 (China)
  3. Department of Physics, Tsinghua University, Beijing 100871 (China)

A strong circular photogalvanic effect (CPGE) in ZnO epitaxial films was reported under interband excitation. It was observed that CPGE current is as large as 100 nA/W in ZnO, which is about one order in magnitude higher than that in InN film while the CPGE currents in GaN films are not detectable. The possible reasons for the above observations are the strong spin orbit coupling in ZnO or the inversed valence band structure of ZnO.

OSTI ID:
21612434
Journal Information:
AIP Conference Proceedings, Vol. 1399, Issue 1; Conference: 30. international conference on the physics of semiconductors, Seoul (Korea, Republic of), 25-30 Jul 2010; Other Information: DOI: 10.1063/1.3666571; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English