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Title: Dielectric Relaxation In Complex Perovskite Sm(Ni{sub 1/2}Ti{sub 1/2})O{sub 3}

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3644432· OSTI ID:21608493
;  [1];  [2]
  1. Deptt. Of Physics, T.M.B.U., Bhagalpur, Bihar (India)
  2. Deptt. Of Physics, Bose Institute, 93/1, A. P. C. Road, Kolkata 700009 (India)

The complex perovskite oxide Samarium nickel titenate, Sm(Ni{sub 1/2}Ti{sub 1/2})O{sub 3}(SNT) is synthesized by a solid-state reaction technique. The X-ray diffraction of the sample at room temperature shows a monoclinic phase. The scanning micrograph of the sample shows the average grain size{approx_equal}0.6{mu}m The field dependence of dielectric response and the loss tangent of the sample are measured in a frequency range from 100Hz to 1MHz and in a temperature range from 313 K to 673 K. An analysis of the real and imaginary parts of the dielectric permittivity with frequency is performed, assuming a distribution of relaxation times as confirmed by Cole-Cole plots. The frequency dependent electrical data are analyzed in the framework of conductivity formalism. The frequency dependent conductivity data are fitted to the universal power law. All these formalisms provided for qualitative similarities in the relaxation times.

OSTI ID:
21608493
Journal Information:
AIP Conference Proceedings, Vol. 1372, Issue 1; Conference: NSFD-14: 14. national seminar on ferroelectrics and dielectrics, Bilaspur, Chhattisgarh (India), 2-4 Dec 2010; Other Information: DOI: 10.1063/1.3644432; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English