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Title: Formation of epitaxial metastable NiGe{sub 2} thin film on Ge(100) by pulsed excimer laser anneal

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.3514242· OSTI ID:21464543
;  [1]; ;  [2];  [3]; ;  [4]
  1. Department of Electrical and Computer Engineering and NUS Graduate School for Integrative Sciences and Engineering (NGS), National University of Singapore (NUS), 10 Kent Ridge Crescent, Singapore 117576 (Singapore)
  2. Institute of Materials Research and Engineering, Agency for Science, Technology, and Research (A-STAR), 3 Research Link, Singapore 117602 (Singapore)
  3. Singapore Institute of Manufacturing Technology, Agency for Science, Technology, and Research (A-STAR), 71 Nanyang Drive, Singapore 638075 (Singapore)
  4. Department of Physics, Centre for Ion Beam Applications (CIBA), National University of Singapore, 2 Science Drive 3, Singapore 117542 (Singapore)

Epitaxial nickel digermanide (NiGe{sub 2}), a metastable phase, was formed by laser annealing Ni on (100) germanium-on-silicon substrates. The NiGe{sub 2} formation was investigated using transmission electron microscopy, energy dispersive x-ray spectroscopy, x-ray diffraction, Rutherford backscattering spectroscopy, and first-principles calculations. The formation mechanism of NiGe{sub 2} is discussed and is attributed to both the reduced interfacial energy at the NiGe{sub 2}/Ge(100) interface and the kinetic aspects of the laser annealing reaction associated with phase transformation and film agglomeration.

OSTI ID:
21464543
Journal Information:
Applied Physics Letters, Vol. 97, Issue 18; Other Information: DOI: 10.1063/1.3514242; (c) 2010 American Institute of Physics; ISSN 0003-6951
Country of Publication:
United States
Language:
English