X-ray Phase Imaging Microscopy using a Fresnel Zone Plate and a Transmission Grating

Journal Article · Wed Jun 23 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3463243· OSTI ID:21431073

Yashiro, Wataru; Momose, Atsushi ^[1]; Takeuchi, Akihisa; Suzuki, Yoshio ^[2]

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1. Department of Advanced Materials Science, Graduate School of Frontier Sciences, University of Tokyo, 5-1-5, Kashiwanoha, Kashiwa, Chiba, 277-8561 (Japan)
2. Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo, 679-5198 (Japan)

We report on a hard X-ray phase imaging microscopy (a phase-difference microscopy) that consists of an objective and a transmission grating. The simple optical system provides a quantitative phase image, and does not need a wave field mostly coherent on the objective. Our method has a spatial resolution almost same as that of the absorption contrast microscope image obtained by removing the grating. We demonstrate how our approach provides a phase image from experimentally obtained images. Our approach is attractive for easily appending a quantitative phase-sensitive mode to normal X-ray microscopes, and has potentially broad applications in biology and material sciences.

• OSTI ID: 21431073
• Journal Information: AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463243; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
DIFFRACTION GRATINGS
GRATINGS
HARD X RADIATION
MICROSCOPES
MICROSCOPY
OPTICAL SYSTEMS
SPATIAL RESOLUTION
TRANSMISSION
WAVEGUIDES
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
RADIATIONS
RESOLUTION
SORPTION
X RADIATION