TEMPO: a New Insertion Device Beamline at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces
- Synchrotron SOLEIL, L'orme des merisiers, Saint-Aubin, BP 48, 91192 Gif-surYvette (France)
A new insertion device beamline is now operational on straight section 8 at the SOLEIL synchrotron radiation source in France. The beamline and the experimental station were developed to optimize the study of the dynamics of electronic and magnetic properties of materials. Here we present the main technical characteristics of the installation and the general principles behind them. The source is composed of two APPLE II type insertion devices. The monochromator with plane gratings and spherical mirrors is working in the energy range 40-1500 eV. It is equipped with VLS, VGD gratings to allow the user optimization of flux or higher harmonics rejection. The observed resonance structures measured in gas phase enable us to determine the available energy resolution: a resolving power higher than 10000 is obtained at the Ar 2p, N 1s and Ne K-edges when using all the optical elements at full aperture. The total flux as a function of the measured photon energy and the characterization of the focal spot size complete the beamline characterization.
- OSTI ID:
- 21431065
- Journal Information:
- AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463169; (c) 2010 American Institute of Physics; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
APERTURES
ENERGY RESOLUTION
GRATINGS
HARMONICS
INTERFACES
MAGNETIC PROPERTIES
MATERIALS
MIRRORS
OPTIMIZATION
PHOTOELECTRON SPECTROSCOPY
PHOTONS
RESONANCE
SOLIDS
SPHERICAL CONFIGURATION
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
TIME RESOLUTION
TRANSMISSION ELECTRON MICROSCOPY
BOSONS
BREMSSTRAHLUNG
CONFIGURATION
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTARY PARTICLES
MASSLESS PARTICLES
MICROSCOPY
OPENINGS
OSCILLATIONS
PHYSICAL PROPERTIES
RADIATION SOURCES
RADIATIONS
RESOLUTION
SPECTROSCOPY
TIMING PROPERTIES