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Title: X-ray phase-contrast imaging with an Inverse Compton Scattering source

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3478194· OSTI ID:21415285
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  1. Dip. di Fisica, Universita di Siena, Italy and Istituto Nazionale di Fisica Nucleare INFN, Sezione di Pisa (Italy)
  2. Strutt. Dip. di Matematica e Fisica, Universita degli Studi di Sassari (Italy) and Istituto Nazionale di Fisica Nucleare INFN, Sezione di Cagliari (Italy)
  3. Dip. di Fisica 'E. Fermi', Universita di Pisa, Italy and Istituto Nazionale di Fisica Nucleare INFN, Sezione di Pisa (Italy)
  4. CSIRO, Materials Science and Engineering, Clayton South, 3169, VIC (Australia)

Single-shot in-line phase-contrast imaging with the Inverse Compton Scattering X-ray source available at ATF (Accelerator Test Facility) at Brookhaven National Laboratory is experimentally demonstrated. Phase-contrast images of polymer wires are obtained with a single X-ray pulse whose time length is about 1 picosecond. The edge-enhancement effect is clearly visible in the images and simulations show a quantitative agreement with experimental data. A phase-retrieval step in the image processing leads to a accurate estimation of the projected thickness of our samples. Finally, a single-shot image of a wasp is presented as an example of a biological sample.

OSTI ID:
21415285
Journal Information:
AIP Conference Proceedings, Vol. 1266, Issue 1; Conference: 6. international conference on medical applications of synchrotron radiation, Melbourne (Australia), 15-18 Feb 2010; Other Information: DOI: 10.1063/1.3478194; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English