Asymmetric magnetization reversal process in Co nanohill arrays
- Instituto de Ciencias de Materiales de Madrid, CSIC Sor Juana Ines de la Cruz 3, Cantoblanco, Madrid 28049 (Spain)
Co thin films deposited by sputtering onto nanostructured polymer [poly(methyl methacrylate)] were prepared following replica-antireplica process based on porous alumina membrane. In addition, different capping layers were deposited onto Co nanohills. Morphological and compositional analysis was performed by atomic force microscopy and x-ray photoemission spectroscopy techniques to obtain information about the surface characteristics. The observed asymmetry in the magnetization reversal process at low temperatures is ascribed to the exchange bias generated by the ferromagnetic-antiferromagnetic interface promoted by the presence of Co oxide detected in all the samples. Especially relevant is the case of the Cr capping, where an enhanced magnetic anisotropy in the Co/Cr interface is deduced.
- OSTI ID:
- 21361929
- Journal Information:
- Journal of Applied Physics, Vol. 106, Issue 10; Other Information: DOI: 10.1063/1.3254195; (c) 2009 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ALUMINIUM OXIDES
ANISOTROPY
ANTIFERROMAGNETIC MATERIALS
ANTIFERROMAGNETISM
ASYMMETRY
ATOMIC FORCE MICROSCOPY
CHROMIUM
COBALT
DEPOSITION
FERROMAGNETIC MATERIALS
LAYERS
MAGNETIZATION
MEMBRANES
METHACRYLIC ACID ESTERS
NANOSTRUCTURES
PHOTOEMISSION
POLYMERS
POROUS MATERIALS
THIN FILMS
X-RAY PHOTOELECTRON SPECTROSCOPY
ALUMINIUM COMPOUNDS
CARBOXYLIC ACID ESTERS
CHALCOGENIDES
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
ESTERS
FILMS
MAGNETIC MATERIALS
MAGNETISM
MATERIALS
METALS
MICROSCOPY
ORGANIC COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
SECONDARY EMISSION
SPECTROSCOPY
TRANSITION ELEMENTS